ASTM F528-1999(2005) 结型晶体管共射极直流增益测量的标准试验方法
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【英文标准名称】:StandardTestMethodofMeasurementofCommon-EmitterD-CCurrentGainofJunctionTransistors
【原文标准名称】:结型晶体管共射极直流增益测量的标准试验方法
【标准号】:ASTMF528-1999(2005)
【标准状态】:作废
【国别】:
【发布日期】:1999
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:晶体管;结型晶体管;方法;结型晶体管共射极直流增益;半导体电流测量
【英文主题词】:common-emitterd-ccurrentgain;currentgain;hFE;junctiontransistors;transistortest
【摘要】:Thecurrentgainofatransistorisbasictoitsoperationandisitssinglemostimportantparameter.Ionizingradiation,thatis,gammaradiationduetoanuclearburst,willdegradethecurrentgainduetolifetimedamageinthebulkmaterial.Degradationofgainwillbegreatestimmediatelyfollowingaburstofionizingradiationandthegainwillrapidlyrecovertoaquasisteady-statevalue.Defectannealingmaycontinueforweeksbutusuallythecurrentgainrecoveryissmallornegligible.Thismethodprovidesaprocedurethatdoesnotrequirespecial-purposetestequipment.Thismethodissuitableforuseforspecificationacceptance,serviceevaluation,ormanufacturingcontrol.1.1Thistestmethodcoversthemeasurementofcommon-emitterd-ccurrentgain(forward,hFE,orinverted,hFEI)ofbipolartransistors,forwhichthecollector-emitterleakagecurrent,ICEO,islessthan10%ofthecollectorcurrent,IC,atwhichthemeasurementistobemade,andforwhichtheshuntleakagecurrentinthebasecircuitislessthan10%ofthebasecurrentrequired.1.2Thistestmethodissuitableformeasurementofcommon-emitterd-ccurrentgainatasinglegivenvalueoftesttransistorcollectorcurrentoroveragivenrangeofcollectorcurrents(forexample,overtherangeofthetransistortobetested).1.2.1Thenominalrangesofcollectorcurrentoverwhichthethreetestcircuitsareintendedtobeusedareasfollows:1.2.1.1Circuit1,lessthan100[mu]A,1.2.1.2Circuit2,from100[mu]Ato100mA,and1.2.1.3Circuit3,greaterthan100mA.1.3Thistestmethodincorporatesteststodetermineifthepowerdissipatedinthetransistorislowenoughthatthetemperatureofthejunctionisapproximatelythesameastheambienttemperature.1.4ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.5Thisstandarddoesnotpurporttoaddressthesafetyproblems,ifany,associatedwithitsuse.Itistheresponsibilityofwhoeverusesthisstandardtoconsultandestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L42
【国际标准分类号】:31_080_30
【页数】:7P.;A4
【正文语种】:
【原文标准名称】:结型晶体管共射极直流增益测量的标准试验方法
【标准号】:ASTMF528-1999(2005)
【标准状态】:作废
【国别】:
【发布日期】:1999
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:晶体管;结型晶体管;方法;结型晶体管共射极直流增益;半导体电流测量
【英文主题词】:common-emitterd-ccurrentgain;currentgain;hFE;junctiontransistors;transistortest
【摘要】:Thecurrentgainofatransistorisbasictoitsoperationandisitssinglemostimportantparameter.Ionizingradiation,thatis,gammaradiationduetoanuclearburst,willdegradethecurrentgainduetolifetimedamageinthebulkmaterial.Degradationofgainwillbegreatestimmediatelyfollowingaburstofionizingradiationandthegainwillrapidlyrecovertoaquasisteady-statevalue.Defectannealingmaycontinueforweeksbutusuallythecurrentgainrecoveryissmallornegligible.Thismethodprovidesaprocedurethatdoesnotrequirespecial-purposetestequipment.Thismethodissuitableforuseforspecificationacceptance,serviceevaluation,ormanufacturingcontrol.1.1Thistestmethodcoversthemeasurementofcommon-emitterd-ccurrentgain(forward,hFE,orinverted,hFEI)ofbipolartransistors,forwhichthecollector-emitterleakagecurrent,ICEO,islessthan10%ofthecollectorcurrent,IC,atwhichthemeasurementistobemade,andforwhichtheshuntleakagecurrentinthebasecircuitislessthan10%ofthebasecurrentrequired.1.2Thistestmethodissuitableformeasurementofcommon-emitterd-ccurrentgainatasinglegivenvalueoftesttransistorcollectorcurrentoroveragivenrangeofcollectorcurrents(forexample,overtherangeofthetransistortobetested).1.2.1Thenominalrangesofcollectorcurrentoverwhichthethreetestcircuitsareintendedtobeusedareasfollows:1.2.1.1Circuit1,lessthan100[mu]A,1.2.1.2Circuit2,from100[mu]Ato100mA,and1.2.1.3Circuit3,greaterthan100mA.1.3Thistestmethodincorporatesteststodetermineifthepowerdissipatedinthetransistorislowenoughthatthetemperatureofthejunctionisapproximatelythesameastheambienttemperature.1.4ThevaluesstatedinInternationalSystemofUnits(SI)aretoberegardedasstandard.Nootherunitsofmeasurementareincludedinthisstandard.1.5Thisstandarddoesnotpurporttoaddressthesafetyproblems,ifany,associatedwithitsuse.Itistheresponsibilityofwhoeverusesthisstandardtoconsultandestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L42
【国际标准分类号】:31_080_30
【页数】:7P.;A4
【正文语种】:
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点击此处下载